Erik Larsson "Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)"
Springer (2005-11-07) | ISBN 1402032072 | 388 Pages | PDF | 5.3 Mb
Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective.