Channing C. Ahn “Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas"
Wiley-VCH | 2005-01-04 | ISBN: 3527405658 | PDF | 472 pages | 11,3 Mb
This book package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials.
Transmission electron microscopy is a workhorse for characterizing the microstructure of materials that range from polymers to superconductors. Electron energy loss spectrometry is a relatively new addition to the group of diffraction, imaging and spectroscopic techniques available for the study of materials with the transmission electron microscope. Many of themethods that are required to convert from an understanding of electron scattering physics to a new understanding of a material can be daunting. Transmission Electron Energy Loss Spectrometry in Materials Science is the result of a growing demand from materials scientists to combine analytical tools and problem-solving approaches. We hope that this emphasis on applications can help to shorten the learning curve necessary to achieve productive EELS experiments Rapid changes in instrumentation and the associated analytical methods require
an update for even the seasoned veterans of energy-loss studies. These changes include high quantum efficiency parallel detection systems, powerful analysis algorithms, and advanced spectroscopic imaging techniques.
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