- Author(s): Eugene Machlin
- ISBN: 9780080446394
- Publisher: Elsevier Science
- Edition: 2
- Date: 09 Dec 2005
- Pages: 228
Part II of 'Materials Science in Microelectronics' focuses on the latter of these relationships, examining the effect of structure on the following:
Electrical properties
Magnetic properties
Optical properties
Mechanical properties
Mass transport properties
Interface and junction properties
Defects and properties
* Captures the importance of thin films to microelectronic development
* Examines the cause / effect relationship of structure on thin film properties
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